Extracting Bulk Trap Density of Oxide Semiconductor Thin Films Using Space Charge Limited Current | Intelligent Semiconductor and Wearable Devices

Extracting Bulk Trap Density of Oxide Semiconductor Thin Films Using Space Charge Limited Current

2024/01/26
Changeon Jin, Taewon Seo, Yoonyoung Chung
Korean Conference on Semiconductors (KCS), Gyeongju, Korea

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